Call for Applied Surface Science Abstracts
For the 2011 ASSD Program, please click here.
Applied Surface Science is of major importance to innovation and manufacturing across a broad range of industrial sectors as well as fundamental research. The Applied Surface Science Division (AS) focuses on topics including quantitative surface analysis and data interpretation, practical surface analysis (e.g. insulators and challenging samples), recent developments and applications of techniques. We welcome original work in electron and optical spectroscopies, all aspects of surface mass spectrometry, multi-technique analysis and, this year, have a special emphasis on scanning probe microscopy in a joint session with Biomaterial Interfaces (BI) and Nanometer-scale Science & Technology (NS) Divisions. We welcome abstracts on techniques such as atom probe tomography and combined surface analysis with FIB to our 3D chemical analysis session. This year we are delighted to co-sponsor the BI plenary session with a theme of “Challenges in Biomaterials Analysis” as well as joint sessions on the characterization and functionalization of nanoparticles. We are excited to support the AVS Focus Topics on Spectroscopic Ellipsometry (EL), Helium Ion Microscopy (HI), In Situ Spectroscopy and Microscopy (IS), Tribology (TR) and Transparent Conductors and Printable Electronics (TC). Our popular annual poster session will cover all aspects of applied surface science. Students are encouraged to participate in the student presentation competition; both posters and oral presentations will be considered.
- AS1 Quantitative Surface Chemical Analysis
and Technique Development
Sven Tougaard, University of Southern Denmark, "Characterization of Nano-structures from Analysis of the XPS Background: Automation and 3D-imaging"
- AS2 Imaging and 3D Chemical Analysis
Takuya Miyayama, ULVAC-PHI, Japan, "Recent Applications of GCIB Depth Profiling with XPS and TOF-SIMS"
Wilfried Vandervorst, IMEC, Belgium, "Advances in Probing 3D Semiconductor Structures"
- AS3 Correlative Analysis - A
Multi-technique Approach for Identification and Structure-Property
Relationships
Kathryn G. Lloyd, DuPont Corporate Center for Analytical Sciences, "Challenges with Multi-technique Correlation of Surface Analytical Methods"
- AS4 Analysis of Insulators and Challenging
Samples
Donald R. Baer, Pacific Northwest National Laboratory, "Working with Difficult Samples - Preparation, Damage, Charging and Data Analysis"
- AS5+BI Quantitative Chemical Analysis of
Soft Materials and Biomaterials
Ralf Richter, CIC biomaGUNE, Spain, "Surface-based Model Systems of Biomolecular Hydrogels - From Supramolecular Organization and Dynamics to Biological Function"
- AS6+BI Nano-Object (including
Nanoparticles) Chemical Characterization
Emile Schweikert, Texas A&M University, "Characterization of Nano-objects by Cluster-SIMS"
- AS7+BI+NS Advances in Scanning Probe
Microscopy
Toshio Ando, Kanazawa University, Japan, "High-Speed Atomic Force Microscopy for Filming Biomolecular Processes"
Christopher Yip, University of Toronto, Canada, "Advances in Characterizing Membranes and Cells using Atomic Force Microscopy"
- AS8 Applied Surface Science Poster Session
- BI4+AS+NS+SS Surface Functionalization of
Nanostructures
Holger Schönherr, University of Siegen, Germany, "Surface Functionalization and Analysis of Functional "Soft" Nanostructures: From 2 to 3 Dimensions"
- BI5+AS Characterization of Biomedical
Materials
- BI7+AS Quantitative Analysis of
Biomaterials
Erika Johnston, Genzyme, "Industrial Biosurface Analysis: A Surfeit of New Frontiers"
- BP1+AS Challenges in Biomaterials Analysis
David Castner, University of Washington, "Wants, Needs, and Challenges in Biomedical Surface Analysis"
Yves Dufrene, Université catholique de Louvain, Belgium, "Nanoscale Surface Analysis of Living Cells using Atomic Force Microscopy"
Alex Shard, National Physical Laboratory, UK, "Depth Profiling and 3D Analysis of Organic Surfaces"
- EL1+AS+TF+MS+EM+PS Spectroscopic
Ellipsometry for Photovoltaics and Inorganic Thin Films
Dean Levi, National Renewable Energy Laboratory, "Applications of Ellipsometry in Photovoltaics"
- EL2+AS+TF+MS+EM+PS Spectroscopic
Ellipsometry of Organic and Biological Materials
Klaus-Jochen Eichhorn, Leibniz-Institut für Polymerforschung Dresden e.V., Germany, "Application of Various Spectroscopic Ellipsometry Techniques for In Situ Studies of Thin Polymer Films on Solid Substrates"
- EL3+AS+TF+MS+EM+PS Spectroscopic
Ellipsometry – Fundamentals, New Techniques, & Future Directions
James Hilfiker, J.A. Woollam Co., Inc., "Current Trends and Future Outlook for Spectroscopic Ellipsometry"
- HI1+AS Basics of Helium Ion Microscopy
David C. Bell, Harvard University, "Applications of Helium Ion Microscopy"
Colin A. Sanford, Carl Zeiss, Inc., "Principles of Helium Ion Microscopy"
- HI2+AS+BI+NS Nano- and Bio- Imaging with
Helium Ion Microscopy
Daniel S. Pickard, National University of Singapore, "Aspects of BioImaging"
Hongzhou Zhang, Trinity College, Ireland, "Imaging of Nanostructures"
- IS1+AS+SS In Situ Surface Science Studies
Miquel Salmeron, Lawrence Berkeley National Laboratory, “The changing structure of surfaces when in gaseous and liquid environments”
- IS2+AS+SS In Situ Film Growth Studies
Guus Rijnders, University of Twente, the Netherlands, “Real-time Growth Characterization using Atomic Force Microscopy”
- IS3+AS In Situ Studies in Novel
Environments
Niels De Jonge, Vanderbilt University, “Imaging Whole Cells in Liquid with Scanning Transmission Electron Microscopy”
- IS4+AS+SS In Situ Beam-Scattering Studies
Anatoly Frenkel, Yeshiva University, “In Situ X-Ray Studies”
- IS5+AS In Situ Studies of Structure &
Mechanical Properties
Ian Robertson, University of Illinois at Urbana-Champaign and National Science Foundation, "In Situ TEM Studies of Structural Evolution"
- NM6+AS+MS Metrology for Nanomanufacturing
Dawn Bonnell, University of Pennsylvania, “Local Probes Enabling Science and Manufacturing”
- NT1+AS+MI Magnetic Thin Films and
Multilayers
Thomas Brueckel, Forschungszentrum Jülich, Germany
Chris Leighton, University of Minnesota, “Nanoscopic "Magnetic Phase Separation at the SrTiO3/La1-xSrxCoO3 Interface”
- NT2+AS Neutron Scattering for Energy
Conversion
Jerzy Chlistunoff, Los Alamos National Laboratory, "Nafion-Carbon-Platinum Interfaces Studies using Neutron Scattering and Electrochemical Methods"
Michael Kent, Sandia National Laboratories
- NT3+AS+BI Biological Interfaces, Membranes,
Thin Films
Eva Y. Chi, University of New Mexico
Mike Reinschtedter, McMaster University, Canada
- TC1+AS Growth, Processing, and
Characterization of Transparent Conductors
Su-Huai Wei, National Renewable Energy Laboratory, "Multi-component Transparent Conducting Oxides: Progress in Materials Modeling"
- TR2+AS+SS Atomic-scale Characterization of
Tribological Interfaces
Michael Falk, Johns Hopkins University, "Accelerated Molecular Dynamics Simulations of Tribological Interfaces"
AVS 58 Quick Links:
AVS Publications Digital Library
Questions? E-mail avsnyc@avs.org or call 212-248-0200
Abstract Deadline: May 4, 2011